Atomic structure and core composition of partial dislocations and dislocation fronts in β-SiC by high-resolution transmission electron microscopy

By Lancin M.   Ragaru C.   Godon C.  

Philosophical Magazine B, Vol. 81, Iss. 11, 2001-11 ,pp. : 1633-1647

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On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

By Kret Sławomir   Dłużewski Paweł   Dłużewski Piotr   Laval Jean-Yves  

Philosophical Magazine, Vol. 83, Iss. 2, 2003-01 ,pp. : 231-244

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High-resolution transmission electron microscopy imaging of misfit-dislocation networks at Cu-MgO and Cu-MnO interfaces

By Groen H. B.   Kooi B. J.   Vellinga W .P.   Dehosson J. Th. M.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 9, 1999-09 ,pp. : 2083-2101

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High-resolution observation of basal-plane C-core edge dislocations in 4H-SiC crystal by transmission electron microscopy

By Matsuhata Hirofumi  

Philosophical Magazine, Vol. 92, Iss. 31, 2012-11 ,pp. : 3780-3788

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High-resolution transmission electron microscopy study of luminescent anodized amorphous silicon

By Bustarret E.   Sauvain E.   Ligeon M.  

Philosophical Magazine Letters, Vol. 75, Iss. 1, 1997-01 ,pp. : 35-42

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