On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

Author: Kret Sławomir   Dłużewski Paweł   Dłużewski Piotr   Laval Jean-Yves  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.83, Iss.2, 2003-01, pp. : 231-244

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