On robust two-pattern testing of one-dimensional CMOS iterative logic arrays

Author： Gizopoulos Dimitris   Paschalis Antonis   Nikolos Dimitris   Halatsis Constantine  

Publisher： Taylor & Francis Ltd

ISSN： 1362-3060

Source： International Journal of Electronics, Vol.86, Iss.8, 1999-08, pp. : 967-978

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