Measurements of the nonlinear refractive index of freestanding porous silicon layers at different wavelengths

Author： Lettieri S.   Maddalena P.   Odierna L. P.   Ninno D.   Ferrara V. La   Francia G. Di  

Publisher： Taylor & Francis Ltd

ISSN： 1463-6417

Source： Philosophical Magazine B, Vol.81, Iss.2, 2001-02, pp. : 133-139

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