Ultrasonic characterization of the interface between a die attach adhesive and a copper leadframe in IC packaging

Author: Guo N.   Abdul J.   Wong B. S.  

Publisher: Taylor & Francis Ltd

ISSN: 1568-5616

Source: Journal of Adhesion Science and Technology, Vol.16, Iss.9, 2002-09, pp. : 1261-1279

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract