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Author: Ooi Keng Boon Bakar Nooh Abu Arumugam Veeri Vellapan Lorraine Loke Alex Kim Yin
Publisher: Emerald Group Publishing Ltd
ISSN: 0265-671X
Source: International Journal of Quality & Reliability Management, Vol.24, Iss.1, 2007-01, pp. : 62-77
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