Finite element analyses and lifetime predictions for SnAgCu solder interconnections in thermal shock tests

Author: Li Jue   Xu Hongbo   Hokka Jussi   Mattila Toni T.   Chen Hongtao   Paulasto-Kröckel Mervi  

Publisher: Emerald Group Publishing Ltd

ISSN: 0954-0911

Source: Soldering & Surface Mount Technology, Vol.23, Iss.3, 2011-06, pp. : 161-167

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Abstract