X-ray emission spectroscopy, transmission electron microscope, DOS of the valence band, soft-X-ray spectrometer, B K-emission spectra, hexagonal boron-nitride

Author: Terauchi M.  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.50, Iss.2, 2001-01, pp. : 101-104

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content