Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopesan introduction of valence electron spectroscopy for transmission electron microscopy

Author: Terauchi Masami   Koike Masato   Fukushima Kurio   Kimura Atsushi  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.59, Iss.4, 2010-08, pp. : 251-261

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