Simulation of Electron Trajectories of Wien Filter for High-Resolution EELS Installed in TEM

By Tsuno Katsushige  

Journal of Electron Microscopy, Vol. 45, Iss. 5, 1996-10 ,pp. : 417-427

Oxford University Press

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Measurement of Electric Potential Distributions Around Feg-Emitters by Electron Holography

By Oikawa Tetsuo   Kim Joong Jung   Tomita Takeshi   Park Hyun Soon   Shindo Daisuke  

Journal of Electron Microscopy, Vol. 56, Iss. 5, 2007-10 ,pp. : 171-175

Oxford University Press

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

By Biskupek Johannes   Kaiser Ute   Falk Fritz  

Journal of Electron Microscopy, Vol. 57, Iss. 3, 2008-06 ,pp. : 83-89

Oxford University Press

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Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolution

By Kim Hyonchol   Negishi Tsutomu   Kudo Masato   Takei Hiroyuki   Yasuda Kenji  

Journal of Electron Microscopy, Vol. 59, Iss. 5, 2010-10 ,pp. : 379-385

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