Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy

By Biskupek Johannes   Kaiser Ute   Falk Fritz  

Journal of Electron Microscopy, Vol. 57, Iss. 3, 2008-06 ,pp. : 83-89

Oxford University Press

Access to resources Recommend Favorite

High-resolution low-dose scanning transmission electron microscopy

By Buban James P.   Ramasse Quentin   Gipson Bryant   Browning Nigel D.   Stahlberg Henning  

Journal of Electron Microscopy, Vol. 59, Iss. 2, 2010-04 ,pp. : 103-112

Oxford University Press

Access to resources Recommend Favorite

Seto Award 1996. High-resolution transmission electron microscopy of high-T c oxycarbonate superconductors

By Matsui Y.  

Journal of Electron Microscopy, Vol. 46, Iss. 2, 1997-01 ,pp. : 135-150

Oxford University Press

Access to resources Recommend Favorite

Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

Access to resources Recommend Favorite

A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples

By Yao Bo   Petrova Rumyana V.   Vanfleet Richard R.   Coffey Kevin R.  

Journal of Electron Microscopy, Vol. 55, Iss. 4, 2006-08 ,pp. : 209-214

Oxford University Press

Access to resources Recommend Favorite