A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy

By Fukuda Muneyuki  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 479-483

Oxford University Press

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Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis

By Tsuji Satoshi  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 465-470

Oxford University Press

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Development of an active targeting liposome encapsulated with high-density colloidal gold for transmission electron microscopy

By Minematsu Hideki   Otani Takayuki   Oohashi Toshitaka   Hirai Masahiko   Oie Kazunori   Igarashi Koichi   Ohtsuka Aiji  

Journal of Electron Microscopy, Vol. 60, Iss. 1, 2011-02 ,pp. : 95-99

Oxford University Press

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A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples

By Yao Bo   Petrova Rumyana V.   Vanfleet Richard R.   Coffey Kevin R.  

Journal of Electron Microscopy, Vol. 55, Iss. 4, 2006-08 ,pp. : 209-214

Oxford University Press

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electron microscopy, scanning transmission, thin annular detectors, nanodiffraction, nanocrystals

By Cowley M  

Journal of Electron Microscopy, Vol. 50, Iss. 3, 2001-05 ,pp. : 147-155

Oxford University Press

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