Automated specimen search in cryo-TEM observation with DIFF-defocus imaging

Author: Nakamura Natsuko   Shimizu Yuko   Shinkawa Takao   Nakata Munetaka   Bammes Benjamin   Zhang Junjie   Chiu Wah  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.59, Iss.4, 2010-08, pp. : 299-310

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Abstract