Calculation of integrated intensities in aberration-corrected Z -contrast images

By Molina Sergio I.   Guerrero Maria P.   Galindo Pedro L.   Sales David L.   Varela Maria   Pennycook Stephen J.  

Journal of Electron Microscopy, Vol. 60, Iss. 1, 2011-02 ,pp. : 29-33

Oxford University Press

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Calculations of spherical aberration‐corrected imaging behaviour

By Chang Lan Yun  

Journal of Electron Microscopy, Vol. 52, Iss. 4, 2003-09 ,pp. : 359-364

Oxford University Press

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Prospects of atomic resolution imaging with an aberration–corrected STEM

By Ishizuka K.  

Journal of Electron Microscopy, Vol. 50, Iss. 4, 2001-08 ,pp. : 291-305

Oxford University Press

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Direct imaging of lithium atoms in LiV 2 O 4 by spherical aberration-corrected electron microscopy

By Oshima Yoshifumi   Sawada Hidetaka   Hosokawa Fumio   Okunishi Eiji   Kaneyama Toshikatsu   Kondo Yukihito   Niitaka Seiji   Takagi Hidenori   Tanishiro Yasumasa   Takayanagi Kunio  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 457-461

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Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in STEM

By Xin Huolin L.   Muller David A.  

Journal of Electron Microscopy, Vol. 58, Iss. 3, 2009-06 ,pp. : 157-165

Oxford University Press

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