Reduction of anisotropic image resolution in transmission electron microtomography by use of quadrangular prism-shaped section

By Kaneko Takeshi   Nishioka Hideo   Nishi Toshio   Jinnai Hiroshi  

Journal of Electron Microscopy, Vol. 54, Iss. 5, 2005-10 ,pp. : 437-444

Oxford University Press

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Development of wavelength-dispersive soft X-ray emission spectrometers for transmission electron microscopesan introduction of valence electron spectroscopy for transmission electron microscopy

By Terauchi Masami   Koike Masato   Fukushima Kurio   Kimura Atsushi  

Journal of Electron Microscopy, Vol. 59, Iss. 4, 2010-08 ,pp. : 251-261

Oxford University Press

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X-ray emission spectroscopy, transmission electron microscope, DOS of the valence band, soft-X-ray spectrometer, B K-emission spectra, hexagonal boron-nitride

By Terauchi M.  

Journal of Electron Microscopy, Vol. 50, Iss. 2, 2001-01 ,pp. : 101-104

Oxford University Press

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Advances in energy-filtering transmission electron microscopy

By Sigle W.   Zern A.   Hahn K.   Eigenthaler U.   Rühle M.  

Journal of Electron Microscopy, Vol. 50, Iss. 6, 2002-02 ,pp. : 509-515

Oxford University Press

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A simple technique for the estimation of the voltage of a transmission electron microscope

By Rao Duggi V. Sridhara  

Journal of Electron Microscopy, Vol. 57, Iss. 4, 2008-08 ,pp. : 119-122

Oxford University Press

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