Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Transmission electron microscopy and atom probe specimen preparation from mechanically alloyed powder using the focused ion-beam lift-out technique

By Choi Pyuck-Pa   Kwon Young-Soon   Kim Ji-Soon   Al-Kassab Tala’at  

Journal of Electron Microscopy, Vol. 56, Iss. 2, 2007-04 ,pp. : 43-49

Oxford University Press

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A specimen preparation technique for plane-view studies ofsurfaces using transmission electron microscopy

By Foss Steinar   Taft Johan   Haakenaasen Randi  

Journal of Electron Microscopy, Vol. 59, Iss. 1, 2010-02 ,pp. : 27-31

Oxford University Press

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Ultrathin specimen preparation by a low-energy Ar-ion milling method

By Mitome Masanori  

Journal of Electron Microscopy, Vol. 62, Iss. 2, 2013-04 ,pp. : 321-326

Oxford University Press

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Removing focused ion-beam damages on transmission electron microscopy specimens by using a plasma cleaner

By Hata Satoshi   Sosiati Harini   Kuwano Noriyuki   Itakura Masaru   Nakano Takayoshi   Umakoshi Yukichi  

Journal of Electron Microscopy, Vol. 55, Iss. 1, 2006-01 ,pp. : 23-26

Oxford University Press

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