Automated Micro-Raman Mapping and Imaging Applied to Silicon Devices and Zirconia Ceramic Stress and Grain Boundary Morphology

Author： Bowden Michael Dickson George D. Gardiner Derek J. Wood David J.

Publisher： Society for Applied Spectroscopy

ISSN： 0003-7028

Source： Applied Spectroscopy, Vol.44, Iss.10, 1990-12, pp. : 1679-1684

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