Precision and Noise in Inductively Coupled Plasma Atomic Emission Spectroscopy with Charge-Injection Device Detection

By Pennebaker Frank M.   Denton M. Bonner  

Applied Spectroscopy, Vol. 55, Iss. 6, 2001-06 ,pp. : 722-729

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Elemental Analysis with a Plasma Emission Echelle Spectrometer Employing a Charge Injection Device (CID) Detector

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Applied Spectroscopy, Vol. 43, Iss. 1, 1989-01 ,pp. : 1-11

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High-Precision, Simultaneous Analysis of Pt, Pd, and Rh in Catalytic Converter Samples by Carius Tube Dissolution and Inductively Coupled Plasma Atomic Emission Spectroscopy with Charge-Injection Device Detection

By Pennebaker Frank M.   Denton M. Bonner  

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Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

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Applied Spectroscopy, Vol. 49, Iss. 10, 1995-10 ,pp. : 1478-1484

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Direct Injection Nebulizer-Coupled Microwave-Induced Plasma for Atomic Emission Spectroscopy

By Ng Kin C.   Culp Robbey C.  

Applied Spectroscopy, Vol. 51, Iss. 10, 1997-10 ,pp. : 1447-1452

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