Wide Dynamic Range Detection with a Charge Injection Device (CID) for Quantitative Plasma Emission Spectroscopy

By Bilhorn Robert B.   Denton M. Bonner  

Applied Spectroscopy, Vol. 44, Iss. 9, 1990-11 ,pp. : 1538-1546

Society for Applied Spectroscopy

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Quantitative Analysis of Molybdenum in Tungsten Compounds with a New Approach to the Internal Standard Method Using a Direct-Current/Arc Echelle Spectrometer with CID Detector

By Spitsberg A. T.   Stephens J. S.   Deelo M.   Hodges C. E.  

Applied Spectroscopy, Vol. 53, Iss. 11, 1999-11 ,pp. : 1479-1482

Society for Applied Spectroscopy

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Design and Characterization of an Echelle Spectrometer for Fundamental and Applied Emission Spectrochemical Analysis

By Scheeline Alexander   Bye Cheryl A.   Miller Duane L.   Rynders Steven W.   Owen R. Calvin  

Applied Spectroscopy, Vol. 45, Iss. 3, 1991-03 ,pp. : 334-346

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Use of Normalized Relative Line Intensities for Qualitative and Semi-Quantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part I: Principle and Feasibility

By Soudier Luc   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 49, Iss. 10, 1995-10 ,pp. : 1478-1484

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Use of Normalized Relative Line Intensities for Qualitative and Semiquantitative Analysis in Inductively Coupled Plasma Atomic Emission Spectrometry Using a Custom Segmented-Array Charge-Coupled Device Detector. Part III: Application to Laser Ablation

By Cabalin Luisa Maria   Mermet Jean-Michel  

Applied Spectroscopy, Vol. 51, Iss. 6, 1997-06 ,pp. : 898-901

Society for Applied Spectroscopy

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