GPU-accelerated white-light scanning interferometer for large-area, high-speed surface profile measurements

Author: You Joonho   Kim Young-Jin   Kim Seung-Woo  

Publisher: Inderscience Publishers

ISSN: 1746-9392

Source: International Journal of Nanomanufacturing, Vol.8, Iss.1-2, 2012-01, pp. : 31-39

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Abstract