Defect classification in two-layer complex structures based on spectrum analysis of pulsed eddy current

Author: Hu Xiangchao   He Yunze   Luo Feilu  

Publisher: The British Institute of Non-Destructive Testing

ISSN: 1354-2575

Source: Insight - Non-Destructive Testing and Condition Monitoring, Vol.53, Iss.3, 2011-03, pp. : 146-151

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