The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths

Author： Smith A.D. Schofield P.F. Cressey G. Cressey B.A. Read P.D.

ISSN： 0026-461X

Source： Mineralogical Magazine, Vol.68, Iss.6, 2004-12, pp. : 859-869

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