In situ cleavage mechanism for semiconductor single crystals for ultrahigh-vacuum scanning tunneling microscope

Author: Oreshkin S.   Mantsevich V.   Muzychenko D.   Oreshkin A.   Panov V.   Radchenko I.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.50, Iss.1, 2007-02, pp. : 129-132

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