A technique for recording and analyzing the isothermal relaxation of the capacitance of semiconductor heterostructures

Author: Bezryadin N.   Kotov G.   Kadantsev A.   Vasil’eva L.   Vlasov Yu.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 0020-4412

Source: Instruments and Experimental Techniques, Vol.53, Iss.3, 2010-05, pp. : 430-433

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content