Irradiation induced lattice defects in Si1−xGex devices and their effect on device performance

Author： Ohyama H.   Vanhellemont J.   Takami Y.   Hayama K.   Sunaga H.   Poortmans J.   Caymax M.   Clauws P.  

Publisher： Maney Publishing

ISSN： 1743-2847

Source： Materials Science and Technology, Vol.11, Iss.4, 1995-04, pp. : 429-435

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