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International Journal of Materials and Product Technology, Vol. 22, Iss. 1-2, 2004-11 ,pp. : 84-94

Inderscience Publishers

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Complexing of platinum in float zone and Czochralski silicon – electron paramagnetic resonance study of 6-platinum clusters and oxygen related 1-platinum midgap defect

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Different interface approximations in multi-domain GDQ simulation of Czochralski bulk flows

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Infrared Tomography of the Lifetime and the Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots

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