Comparison of quantum Hall effect resistance standards of the OFMET and the BIPM

Author： Delahaye F.   Witt T. J.   Jeckelmann B.   Jeanneret B.  

Publisher： IOP Publishing

ISSN： 0026-1394

Source： Metrologia, Vol.32, Iss.5, 1995-10, pp. : 385-388

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Comparison of quantum Hall effect resistance standards of the NIST and the BIPM

By Delahaye F.   Witt T. J.   Elmquist R. E.   Dziuba R. F.  

Metrologia, Vol. 37, Iss. 2, 2000-07 ,pp. : 173-176

IOP Publishing

Access to resources Recommend Favorite

Comparison of quantum Hall effect resistance standards of the PTB and the BIPM

By Delahaye F.   Witt T. J.   Pesel E.   Schumacher B.   Warnecke P.  

Metrologia, Vol. 34, Iss. 3, 1997-09 ,pp. : 211-213

IOP Publishing

Access to resources Recommend Favorite

On the synthesis of quantum Hall array resistance standards

By  

Metrologia, Vol. 52, Iss. 1, 2015-02 ,pp. : 31-39

IOP Publishing

Access to resources Recommend Favorite

Comparison of the Josephson voltage standards of the IEN and the BIPM

By Reymann D.   Witt T. J.   Andreone D.   Cerri R.   Godone A.  

Metrologia, Vol. 35, Iss. 1, 1998-02 ,pp. : 21-24

IOP Publishing

Access to resources Recommend Favorite

Comparison of the Josephson voltage standards of the NIM (China) and the BIPM

By Reymann D.   Xue S. Q.   Liu R. M.   Li H. H.   Gao J.   Zhou Y. Q.   Witt T. J.  

Metrologia, Vol. 33, Iss. 5, 1996-10 ,pp. : 475-478

IOP Publishing

Access to resources Recommend Favorite