Re-examination of the extraction of MOS interface-state density by C–V stretchout and conductance methods

Author： Chen Han-Ping Yuan Yu Yu Bo Chang Chih-Sheng Wann Clement Taur Yuan

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.28, Iss.8, 2013-08, pp. : 85008-85012

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