Period of time： 2016年8期
Publisher： IOP Publishing
Founded in： 1986
Total resources： 42
ISSN： 0268-1242
Subject： TN Radio Electronics, Telecommunications Technology
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Semiconductor Science and Technology,volume 28,issue 8
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Modeling of strain effects on the device behaviors of ferroelectric memory field-effect transistors
By Yang Feng,Hu Guangda,Wu Weibing,Yang Changhong,Wu Haitao,Tang Minghua in (2013)
Semiconductor Science and Technology,volume 28,issue 8 , Vol. 28, Iss. 8, 2013-08 , pp.
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