Cross structured illumination for high speed high resolution line scanning confocal microscopy

Author： Ahn MyoungKi   Kim Taejoong   Kim YoungDuk   Gweon DaeGab   Lee Jun-Hee  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.22, Iss.1, 2011-01, pp. : 15503-15510

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