The study of electronic conduction in amorphous thin films of Al-In₂O₃-Al structure deposited by thermal evaporation

ISSN： 0011-4626

Source： Czechoslovak Journal of Physics, Vol.55, Iss.10, 2005-10, pp. : 1261-1274

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Hardness measurements at shallow depths on ultra-thin amorphous carbon films deposited onto silicon and Al 2 O 3 -TiC substrates

By Lemoine P. Zhao J.F. Quinn J.P. McLaughlin J.A. Maguire P.

Thin Solid Films, Vol. 379, Iss. 1, 2000-12 ,pp. : 166-172

Elsevier

Access to resources Recommend Favorite

Photolithographic deposition of insulating Al 2 O 3 films from thin amorphous films of aluminum complexes on silicon surfaces

By Law W.L. Hill R.H.

Thin Solid Films, Vol. 375, Iss. 1, 2000-10 ,pp. : 42-45

Elsevier

Access to resources Recommend Favorite

Effects of Al₂O₃ Buffer Layer on the Properties of ZnO: Al Thin Films Deposited on Glass by Sputtering

Materials Science Forum, Vol. 2016, Iss. 848, 2016-04 ,pp. : 301-304

Trans Tech Publications

Access to resources Recommend Favorite

On the existence of a nanometric multilayered structure in Al 2 O 3 /Al thin films

By Le Paven-Thivet C. Fusil S. Aubert P. Malibert C. Zozime A. Houdy P.

Thin Solid Films, Vol. 446, Iss. 1, 2004-01 ,pp. : 147-154

Elsevier

Access to resources Recommend Favorite

Plasmonic AgAl Bimetallic Alloy Nanoparticle/Al₂O₃ Nanocermet Thin Films with Robust Thermal Stability for Solar Thermal Applications

ADVANCED MATERIALS INTERFACES (ELECTRONIC), Vol. 3, Iss. 16, 2016-08 ,pp. : n/a-n/a

John Wiley & Sons Inc

Access to resources Recommend Favorite