High-Frequency Point-Contact Spectroscopy of TiSi2, TaSi2, and VSi2

Author: Balkashin O.P.   Jansen A.G.M.   Laborde O.   Gottlieb U.   Sukhodub G.L.   Wyder P.   Yanson I.K.  

Publisher: Springer Publishing Company

ISSN: 0022-2291

Source: Journal of Low Temperature Physics, Vol.129, Iss.3-4, 2002-11, pp. : 105-116

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Abstract