Atomic ordering in xZrO2·(1-x) SiO2 xerogels (x=0.3, 0.5) by X-ray diffraction and reverse Monte Carlo simulations

Author: Stachs O.   Gerber T.   Petkov V.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.32, Iss.16, 1997-12, pp. : 4209-4216

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