Photoluminescence study of erbium doped SiO 2 thin films containing Si nanocrystals

Author: Kao C.-C.   Barthou C.   Gallas B.   Fisson S.   Vuye G.   Rivory J.  

Publisher: Elsevier

ISSN: 0921-5107

Source: Materials Science and Engineering: B, Vol.105, Iss.1, 2003-12, pp. : 225-228

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Abstract