Effects of annealing temperature on the carrier concentrations, the carrier mobilities and the quality of nitrogen doped ZnO films deposited by magnetron sputtering

Author: Lim Jongmin   Shin Kyoungchul   Lee Chongmu  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.39, Iss.9, 2004-05, pp. : 3195-3197

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