Low and increased solubility of silicon in metal nitrides: evidence by X-ray absorption near edge structure

Author： Endrino Jose Palacín Sergio Gutiérrez Alejandro Schäffers Franz Krzanowski James

ISSN： 0022-2461

Source： Journal of Materials Science, Vol.42, Iss.17, 2007-09, pp. : 7607-7610

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Characterization of the cobalt component in the positive- electrode material of a nickel metal hydride battery using extended X-ray absorption fine structure

By Sato N.

Journal of Materials Science Letters, Vol. 16, Iss. 8, 1997-08 ,pp. : 621-622

Springer Publishing Company

Access to resources Recommend Favorite

Near infra-red photoluminescence of Nd 3+ in hydrogenated amorphous silicon sub-nitrides a-SiN x :H

By Biggemann D. Tessler L.R.

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 188-191

Elsevier

Access to resources Recommend Favorite

Extended X-ray absorption fine structure spectroscopy of amorphous IR transmitting optical materials

By Mondal K. Lalvani S. B.

Journal of Materials Science, Vol. 39, Iss. 3, 2004-02 ,pp. : 1065-1069

Springer Publishing Company

Access to resources Recommend Favorite

Extended X-ray absorption fine structure (EXAFS) study of secondary phases in Yb2O3-doped Si3N4 ceramics

By Kizler P. Kleebe H.J. Aldinger F. Ruhle M.

Journal of Materials Science, Vol. 32, Iss. 2, 1997-02 ,pp. : 369-374

Springer Publishing Company

Access to resources Recommend Favorite

Fluorescence Extended X-Ray Absorption Fine Structure Study on Local Structures of Rare-Earth-Doped InGaGdN

Advanced Materials Research, Vol. 2016, Iss. 1133, 2016-02 ,pp. : 429-433

Trans Tech Publications

Access to resources Recommend Favorite