Analysis of mineral water from Brazil using total reflection X-ray fluorescence by synchrotron radiation

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Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 12, 2003-12 ,pp. : 2199-2204

Elsevier

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Multielement determination in river-water of Sepetiba Bay tributaries (Brazil) by total reflection X-ray fluorescence using synchrotron radiation

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Journal of Radioanalytical and Nuclear Chemistry, Vol. 269, Iss. 3, 2006-09 ,pp. : 703-706

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Analysis of depth profile for impurity concentration in Si wafer by synchrotron radiation excited total reflection X-ray fluorescence spectroscopy

By Huh B.-K.   Kim J.-S.   Shin N.-S.   Koo Y.-M.   Chung H.-Y.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 8, 2003-08 ,pp. : 1445-1452

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A wavelength-dispersive arrangement for wafer analysis with total reflection X-ray fluorescence spectrometry using synchrotron radiation

By Schwenke H.   Beaven P.A.   Knoth J.   Jantzen E.  

Spectrochimica Acta Part B: Atomic Spectroscopy, Vol. 58, Iss. 12, 2003-12 ,pp. : 2039-2048

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Analysis of fish samples for environmental monitoring and food safety assessment by synchrotron radiation total reflection X-ray fluorescence

By Vives A. E. S.   Moreira S.   Brienza S. M. B.   Zucchi O. L. A. D.   Nascimento Filho V. F.  

Journal of Radioanalytical and Nuclear Chemistry, Vol. 270, Iss. 1, 2006-10 ,pp. : 231-236

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