Use of Neural Network to Control a Refractive Index of SiN Film Deposited by Plasma Enhanced Chemical Vapor Deposition

Author: Kim Byungwhan   Kim Sungmo   Hong Wan-Shick  

Publisher: Springer Publishing Company

ISSN: 0272-4324

Source: Plasma Chemistry and Plasma Processing, Vol.24, Iss.1, 2004-03, pp. : 29-40

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