Author: Shohji Ikuo Yoshida Tomohiro Takahashi Takehiko Hioki Susumu
Publisher: Springer Publishing Company
ISSN: 0957-4522
Source: Journal of Materials Science: Materials in Electronics, Vol.15, Iss.4, 2004-04, pp. : 219-223
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Fatigue crack growth behavior of Sn-Pb and Sn-based lead-free solders
By Zhao J. Mutoh Y. Miyashita Y. Wang L.
Engineering Fracture Mechanics, Vol. 70, Iss. 15, 2003-10 ,pp. :