Innovative methodologies of circuit edit by focused ion beam (FIB) on wafer-level chip-scale-package (WLCSP) devices

Author: Liu Tao-Chi   Chen Chih   Liu Shih-Ting   Chang Ming-Lun   Lin Jandel  

Publisher: Springer Publishing Company

ISSN: 0957-4522

Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.10, 2011-10, pp. : 1536-1541

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