Structural Investigation of Highly Polarized Single-c-Domain thin Films Grown by Magnetron Sputtering with Raman Spectroscopy

Author: Tai T.   Wasa K.   Kim J.   Kouzu T.   Matsuoka M.   Nishide M.   Shima H.   Nishida K.   Yamamoto Takashi  

Publisher: Taylor & Francis Ltd

ISSN: 1058-4587

Source: Integrated Ferroelectrics, Vol.141, Iss.1, 2013-01, pp. : 99-104

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