CRYSTALLIZATION BEHAVIOR OF HfO2 FILMS FOR (Y,Yb)MnO3/HfO2/Si STRUCTURES

By Suzuki Kazuyuki   Kato Kazumi  

Integrated Ferroelectrics, Vol. 94, Iss. 1, 2007-10 ,pp. : 3-10

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INVESTIGATION OF ELECTRICAL PROPERTIES FOR (Y,Yb)MnO 3 /HfO 2 /Si and (Y,Yb)MnO 3 /Y 2 O 3 /Si STRUCTURES

By SUZUKI KAZUYUKI   TANAKA KIYOTAKA   NISHIZAWA KAORI   MIKI TAKESHI   KATO KAZUMI  

Integrated Ferroelectrics, Vol. 75, Iss. 1, 2005-10 ,pp. : 17-25

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The Effects of Buffers on the Microstructure and Electrical Properties of Mn/Y Co-Doped Ba_0.67Sr_0.33TiO₃ Thin Films

By Chen X. Y.   Yang C. L.   Zhang X. S.   Li J.   Liu H.   Xiao D. Q.   Yu P.  

Integrated Ferroelectrics, Vol. 140, Iss. 1, 2012-01 ,pp. : 132-139

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Electrical Properties of PbSrTiO3 Films on Stainless Steel Substrates with LaSrMnO3 Buffer layers

By Pan Han-Chang   Sheng Jiun-Nan   Chou Chen-Chia   Cheng Hsiu-Fung  

Integrated Ferroelectrics, Vol. 46, Iss. 1, 2002-01 ,pp. : 175-184

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Annealing Induced Ordering of SrTiO3 Thin Films Deposited by Laser Ablation Over Si Substrates

By ALMEIDA B.   PIETKA A.   MENDES J.  

Integrated Ferroelectrics, Vol. 63, Iss. 1, 2004-01 ,pp. : 149-154

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