Degree of structural perfection of icosahedral quasicrystalline grains investigated by synchrotron X-ray diffractometry and imaging techniques

Author: Gastaldi J.   Agliozzo S.   Létoublon A.   Wang J.   Mancini L.   Klein H.   Härtwig J.   Baruchel J.   Fisher I. R.   Sato T.   Tsai A. P.   de Boissieu A. M.  

Publisher: Taylor & Francis Ltd

ISSN: 1478-6443

Source: Philosophical Magazine, Vol.83, Iss.1, 2003-01, pp. : 1-29

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