Characterization of deep acceptor level in as-grown ZnO thin film by molecular beam epitaxy

Author： Asghar M.   Mahmood K.   Hasan M. A.   Ferguson I. T.   Tsu R.   Willander M.  

Publisher： IOP Publishing

ISSN： 1674-1056

Source： Chinese Physics B, Vol.23, Iss.9, 2014-09, pp. : 97101-97105

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