The expression correction of transistor current gain and its application in reliability assessment

Author: Haochun Qi   Xiaoling Zhang   Xuesong Xie   Li Zhao   Chengju Chen   Changzhi Lü  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.35, Iss.9, 2014-09, pp. : 94008-94012

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