Publisher： IOP Publishing
ISSN： 1742-6596
Source： Journal of Physics: Conference Series , Vol.113, Iss.1, 2008-05, pp. : 173-176
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
LASER ANNEALING OF Te IMPLANTED IN SILICON
Le Journal de Physique Colloques, Vol. 41, Iss. C1, 1980-01 ,pp. :
Access to resources
Recommend
Comparison of high- and low-frequency electromagnetic field analysis
Journal de Physique III, Vol. 3, Iss. 3, 1993-03 ,pp. :
Electrical resistance of solenoids for high frequency current. Note
Journal de Physique Théorique et Appliquée, Vol. 6, Iss. 1, 1907-01 ,pp. :
Electrical resistance of solenoids for high frequency currents
Journal de Physique Théorique et Appliquée, Vol. 6, Iss. 1, 1907-01 ,pp. :