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Author: Doerk Gregory S Gao He Wan Lei Lille Jeff Patel K C Chapuis Yves-Andre Ruiz Ricardo Albrecht Thomas R
Publisher: IOP Publishing
E-ISSN: 1361-6528|26|8|85304-85312
ISSN: 0957-4484
Source: Nanotechnology, Vol.26, Iss.8, 2015-02, pp. : 85304-85312
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Abstract
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