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Nanotechnology, Vol. 27, Iss. 7, 2016-02 ,pp. : 75701-75706

IOP Publishing

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High viscosity environments: an unexpected route to obtain true atomic resolution with atomic force microscopy

By Weber Stefan A L   Kilpatrick Jason I   Brosnan Timothy M   Jarvis Suzanne P   Rodriguez Brian J  

Nanotechnology, Vol. 25, Iss. 17, 2014-05 ,pp. : 175701-175712

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Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy

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Nanotechnology, Vol. 27, Iss. 6, 2016-02 ,pp. : 65703-65712

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Optimization of the excitation frequency for high probe sensitivity in single-eigenmode and bimodal tapping-mode AFM

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Nanotechnology, Vol. 26, Iss. 16, 2015-04 ,pp. : 165703-165714

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Wafer scale tilt-compensated silicon nanowire atomic force microscopy probes for high aspect ratio geometries

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