Backside optimization for improving avalanche breakdown behavior of 4.5 kV IGBT

Author: Xiaoli Tian   Jiang Lu   Yuan Teng   Wenliang Zhang   Shuojin Lu   Yangjun Zhu  

Publisher: IOP Publishing

ISSN: 1674-4926

Source: Journal of Semiconductors, Vol.36, Iss.3, 2015-03, pp. : 34008-34010

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Abstract