Dependence of memory characteristics on the (ZrO2)x(SiO2)1−x elemental composition for charge trap flash memory applications

Author： Tang Zhenjie   Lu Xubing   Yang Yupeng   Zhang Jing   Li Rong   Zhang Xiwei   Hu Dan   Li Tingxian   Tang Zhenjie  

Publisher： IOP Publishing

E-ISSN： 1361-6641|30|6|65010-65018

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.6, 2015-06, pp. : 65010-65018

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